Exploring the XRD system at IFUAP

A scientist is continuously seeking the truth of nature. There is a jungle of fields to explore from material science to the universe, a scientist could be doing experiments at the laboratory, or maybe they just need a comfortable place to think and create new theories which will explain new phenomena. 

Training day: XRD System  and software High Score Plus, BUAP

Today I was able to explore the XRD system at IFUAP (shown in the above picture). The purpose of this visit was to analyze a previous measured XRD pattern. Gratefully the responsible researcher allows me to manipulate the software High Score Plus to perform a qualitative analysis to identify the phases in the material.

High Score plus, performing phase analysis, and calculation of crystal size.

To identify the phase three steps should be performed in the following sequence:

1. Background determination: This is a must step due phase analysis depends on it.
2. Peak search: Automatic + Manual is the best
3. Phase analysis: Should be restricted to the constitutive elements to gain time. In my case, the restriction increase using just inorganic materials and star quality powder diffraction files (PDFs) from the database.

Once these three steps are done, the analysis gives you three important values: 

• Background: This information is necessary to make a good report where the background should be extracted from the observed XRD measurement.
• Constitutive phases: This data confirms if your material is pure or is mixed
• Crystal size: This parameter gives the size domain D < 100 nm makes you think in the nanoworld.

If you want to know how the XRD system works  watch the following video: 

Have you ever seen an XRD system with your own eyes?

AFM Training - Tip functions

Equipmen: AFM Bruker Dimension Edge 

Responsible research: Dr. Francisco Flores 

Day: 2 

Today I observe how a point for AFM is changed: We need to choose it depending on the material and the measurement we want to perform. For example, the sample of today is gold nanoparticles over a glass substrate then we have tried the TAP300Al-G which is a probe from the company BudgetSensors. This probe is designed for AFM in Tapping mode and is coated with reflective aluminum. 

From the company BudgetSensor, we can discover the function of the tip models: 

• No coating: is designed for topography purpose 
• Backside aluminum coating: is designed to enhance the laser reflectivity and ensure stable measurement form highly reflective surfaces. 
• Backside Gold coating (inertness):  is designed for stable reflection measurement in liquids. 
• Overall coated Gold: is designed and used for Biological Samples and aggressive chemical ambients. Often use for TIP functionalization.  
• Cr and Pt coated probe: is designed for electrical measurement like electrostatic force microscopy. 
• Diamond-like carbon coating: enhance the durability of the tip and is designed to perform many consecutive scans 

Here are some photographies from the training day: 

Figure 1: Change of Tip for AFM Measurement in Bruker Dimension Edge 

Figure 2: Responsible researcher placing the tip in the AFM equipment 

Figure 3:  Getting the sample inside (gold nanoparticles deposited on glass substrate) 

AFM training: Bruker Dimension Edge at IFUAP

Equipmen: AFM Bruker Dimension Edge 

Responsible research: Dr. Francisco Flores 

Day: 1

First training day on AFM Bruker Dimension Edge AFM at the Physics Institute of BUAP. This equipment will allow the measurement of topography properties like roughness and grain size. The researcher in charge explains too that it's possible to acquire electrical conductivity and work function from the surface of the films. 

URL: Product overview 

 

Model: AFM - Bruker Dimension Edge 

Close up of AFM equipment

Connection block card: National Instrument BNC 2110