Equipmen: AFM Bruker Dimension Edge
Responsible research: Dr. Francisco Flores
Day: 1
First training day on AFM Bruker Dimension Edge AFM at the Physics Institute of BUAP. This equipment will allow the measurement of topography properties like roughness and grain size. The researcher in charge explains too that it's possible to acquire electrical conductivity and work function from the surface of the films.
URL: Product overview
Model: AFM - Bruker Dimension Edge
Close up of AFM equipment
Connection block card: National Instrument BNC 2110
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